详细信息
A Note on Lower Bound of Centered L_2 -discrepancy on Combined Designs
文献类型:期刊文献
中文题名:A Note on Lower Bound of Centered L_2 -discrepancy on Combined Designs
英文题名:A Note on Lower Bound of Centered L_2 -discrepancy on Combined Designs
作者:Yi Ju LEI[1];Zu Jun OU[2,3];Hong QIN[2];Na ZOU[4]
第一作者:Yi Ju LEI
机构:[1]Department of Mathematics, Xinxiang University;[2]Faculty of Mathematics and Statistics, Central China Normal University;[3]College of Mathematics and Computer Science, Jishou University;[4]School of Statistics and Mathematics, Zhongnan University of Economics and Law
第一机构:新乡学院数学与信息科学学院
年份:2012
卷号:28
期号:4
起止页码:793-800
中文期刊名:数学学报:英文版
收录:CSTPCD;;Scopus;CSCD:【CSCD2011_2012】;
基金:Supported by SRFDP(Grant No.20090144110002);National Natural Science Foundation of China(Grant No.10671080);Key Project of Chinese Ministry of Education(Grant No.105119);NCET(Grant No.06-672);Scientific Research Plan Item of Hunan Provincial Department of Education(Grant No.10C1091);Innovation Program and Independent Research Project Funded by CCNU
语种:英文
中文关键词:设计中心;计算结果;均匀度;均匀性;关键词;搜索;数值;清晰
外文关键词:Centered L2-discrepancy, optimal foldover plan, uniformity, uniformity pattern
摘要:This note provides a theoretical justification of optimal foldover plans in terms of uniformity. A new lower bound of the centered L2 -discrepancy values of combined designs is obtained, which can be used as a benchmark for searching optimal foldover plans. Our numerical results show that this lower bound is sharper than existing results when more factors reverse the signs in the initial design.
This note provides a theoretical justification of optimal foldover plans in terms of uniformity. A new lower bound of the centered Lu-discrepancy values of combined designs is obtained, which can be used as a benchmark for searching optimal foldover plans. Our numerical results show that this lower bound is sharper than existing results when more factors reverse the signs in the initial design. Keywords Centered L2-discrepancy, optimal foldover plan, uniformity, uniformity pattern
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